OAT: Attesting Operation Integrity of Embedded Devices
Zhichuang Sun and Bo Feng and Long Lu and Somesh Jha. "OAT: Attesting Operation Integrity of Embedded Devices." To appear in IEEE Symposium on Security & Privacy, May 2020.
Zhichuang Sun and Bo Feng and Long Lu and Somesh Jha. "OAT: Attesting Operation Integrity of Embedded Devices." To appear in IEEE Symposium on Security & Privacy, May 2020.
Talk at UC San Francisco, Department of Testing, San Francisco, California
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley CA, USA
Talk at London School of Testing, London, UK
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA